Maryam Shojaei Baghini, Madhav P. Desai. Impact of Technology Scaling on Metastability Performance of CMOS Synchronizing Latches. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 317, IEEE Computer Society, 2002. [doi]
@inproceedings{BaghiniD02, title = {Impact of Technology Scaling on Metastability Performance of CMOS Synchronizing Latches}, author = {Maryam Shojaei Baghini and Madhav P. Desai}, year = {2002}, url = {http://csdl.computer.org/comp/proceedings/vlsid/2002/1441/00/14410317abs.htm}, tags = {synchronization}, researchr = {https://researchr.org/publication/BaghiniD02}, cites = {0}, citedby = {0}, pages = {317}, booktitle = {Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-1299-2}, }