Maryam Shojaei Baghini, Madhav P. Desai. Impact of Technology Scaling on Metastability Performance of CMOS Synchronizing Latches. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 317, IEEE Computer Society, 2002. [doi]
Abstract is missing.