Sandeep R. Bahl, Francisco Baltazar, Yong Xie. A Generalized Approach to Determine the Switching Lifetime of a GaN FET. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.