Sandeep R. Bahl, Jungwoo Joh, Fei Yang. Mission Profile Approach for the Calculation of GaN FET Reliability in Power Supply Applications (Invited). In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 1-7, IEEE, 2024. [doi]
Abstract is missing.