Swapnil Bahl, Shreyans Rungta, Shray Khullar, Rohit Kapur, Anshuman Chandra, Salvatore Talluto, Pramod Notiyath, Ajay Rajagopalan. Unifying scan compression. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 191-196, IEEE, 2014. [doi]
@inproceedings{BahlRKKCTNR14,
title = {Unifying scan compression},
author = {Swapnil Bahl and Shreyans Rungta and Shray Khullar and Rohit Kapur and Anshuman Chandra and Salvatore Talluto and Pramod Notiyath and Ajay Rajagopalan},
year = {2014},
doi = {10.1109/DFT.2014.6962079},
url = {http://dx.doi.org/10.1109/DFT.2014.6962079},
researchr = {https://researchr.org/publication/BahlRKKCTNR14},
cites = {0},
citedby = {0},
pages = {191-196},
booktitle = {2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014},
publisher = {IEEE},
isbn = {978-1-4799-6155-9},
}