Designing Recurrent Neural Networks for Monitoring Embedded Devices

Fin Hendrik Bahnsen, Jan Kaiser, Görschwin Fey. Designing Recurrent Neural Networks for Monitoring Embedded Devices. In 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021. pages 1-4, IEEE, 2021. [doi]

Authors

Fin Hendrik Bahnsen

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Jan Kaiser

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Görschwin Fey

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