Fin Hendrik Bahnsen, Jan Kaiser, Görschwin Fey. Designing Recurrent Neural Networks for Monitoring Embedded Devices. In 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{BahnsenKF21,
title = {Designing Recurrent Neural Networks for Monitoring Embedded Devices},
author = {Fin Hendrik Bahnsen and Jan Kaiser and Görschwin Fey},
year = {2021},
doi = {10.1109/ETS50041.2021.9465460},
url = {https://doi.org/10.1109/ETS50041.2021.9465460},
researchr = {https://researchr.org/publication/BahnsenKF21},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1849-2},
}