Sudarshan Bahukudumbi, Krishnendu Chakrabarty. Wafer-Level Modular Testing of Core-Based SoCs. IEEE Trans. VLSI Syst., 15(10):1144-1154, 2007. [doi]
@article{BahukudumbiC07,
title = {Wafer-Level Modular Testing of Core-Based SoCs},
author = {Sudarshan Bahukudumbi and Krishnendu Chakrabarty},
year = {2007},
doi = {10.1109/TVLSI.2007.903943},
url = {http://dx.doi.org/10.1109/TVLSI.2007.903943},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/BahukudumbiC07},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {15},
number = {10},
pages = {1144-1154},
}