Sudarshan Bahukudumbi, Krishnendu Chakrabarty. Power Management Using Test-Pattern Ordering for Wafer-Level Test During Burn-In. IEEE Trans. VLSI Syst., 17(12):1730-1741, 2009. [doi]
@article{BahukudumbiC09-0,
title = {Power Management Using Test-Pattern Ordering for Wafer-Level Test During Burn-In},
author = {Sudarshan Bahukudumbi and Krishnendu Chakrabarty},
year = {2009},
doi = {10.1109/TVLSI.2008.2006679},
url = {http://dx.doi.org/10.1109/TVLSI.2008.2006679},
tags = {testing},
researchr = {https://researchr.org/publication/BahukudumbiC09-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {17},
number = {12},
pages = {1730-1741},
}