Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar. AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for Big-D/Small-A Mixed-Signal SoCs. In Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007. pages 823-828, IEEE, 2007. [doi]
@inproceedings{BahukudumbiOCI07,
title = {AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for Big-D/Small-A Mixed-Signal SoCs},
author = {Sudarshan Bahukudumbi and Sule Ozev and Krishnendu Chakrabarty and Vikram Iyengar},
year = {2007},
doi = {10.1109/ASPDAC.2007.358091},
url = {http://doi.ieeecomputersociety.org/10.1109/ASPDAC.2007.358091},
tags = {testing},
researchr = {https://researchr.org/publication/BahukudumbiOCI07},
cites = {0},
citedby = {0},
pages = {823-828},
booktitle = {Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007},
publisher = {IEEE},
}