Wafer-Level Defect Screening for Big-D/Small-A Mixed-Signal SoCs

Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar. Wafer-Level Defect Screening for Big-D/Small-A Mixed-Signal SoCs. IEEE Trans. VLSI Syst., 17(4):587-592, 2009. [doi]

Authors

Sudarshan Bahukudumbi

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Sule Ozev

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Krishnendu Chakrabarty

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Vikram Iyengar

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