Interconnect coupling-aware driver modeling in static noise analysis for nanometer circuits

Xiaoliang Bai, Rajit Chandra, Sujit Dey, P. V. Srinivas. Interconnect coupling-aware driver modeling in static noise analysis for nanometer circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 23(8):1256-1263, 2004. [doi]

Abstract

Abstract is missing.