Xiaoliang Bai, Sujit Dey. High-level Crosstalk Defect Simulation for System-on-Chip Interconnects. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 169-177, IEEE Computer Society, 2001. [doi]
Abstract is missing.