Bing-Chuan Bai, Chien-Mo James Li, Augusli Kifli, Even Tsai, Kun-Cheng Wu. Power scan: DFT for power switches in VLSI designs. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
Abstract is missing.