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The Importance of Being Positive in Causal Statistical Fault Localization: Important Properties of Baah et al.'s CSFL Regression Model

Zhuofu Bai, Shih-Feng Sun, Andy Podgurski. The Importance of Being Positive in Causal Statistical Fault Localization: Important Properties of Baah et al.'s CSFL Regression Model. In 1st IEEE/ACM International Workshop on Complex Faults and Failures in Large Software Systems, COUFLESS 2015, Florence, Italy, May 23, 2015. pages 7-13, IEEE, 2015. [doi]

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