Abstract is missing.
- FLAVS: A Fault Localization Add-In for Visual StudioNan Wang, Zheng Zheng, Zhenyu Zhang, Cheng Chen. 1-6 [doi]
- The Importance of Being Positive in Causal Statistical Fault Localization: Important Properties of Baah et al.'s CSFL Regression ModelZhuofu Bai, Shih-Feng Sun, Andy Podgurski. 7-13 [doi]
- Evaluating Bug Finders - Test and Measurement of Static Code AnalyzersAurélien Delaitre, Bertrand Stivalet, Elizabeth Fong, Vadim Okun. 14-20 [doi]
- Cross-Technology, Cross-Layer Defect Detection in IT Systems - Challenges and AchievementsPhilippe-Emmanuel Douziech, Bill Curtis. 21-26 [doi]
- The Role of Environmental Assumptions in Failures of DNA NanosystemsThein Than Tun, Robyn R. Lutz, Brian Nakayama, Yijun Yu, Divita Mathur, Bashar Nuseibeh. 27-33 [doi]
- Emulating Environment-Dependent Software FaultsRoberto Pietrantuono, Stefano Russo, Kishor S. Trivedi. 34-40 [doi]
- Towards Classification of Concurrency Bugs Based on Observable PropertiesSara Abbaspour Asadollah, Hans Hansson, Daniel Sundmark, Sigrid Eldh. 41-47 [doi]
- Modeling and Verification of Zone Controller: The SCADE Experience in China's Railway SystemsJie Qian, Jing Liu, Xiang Chen, Junfeng Sun. 48-54 [doi]
- Defect Analysis over Multiple Release Versions of a Semiconductor Software SystemEric Abuta, Jeff Tian. 55-61 [doi]
- Crying Wolf and Meaning It: Reducing False Alarms in Monitoring of Sporadic Operations through POD-MonitorXiwei Xu, Liming Zhu, Min Fu, Daniel Sun, An Binh Tran, Paul Rimba, Srini Dwarakanathan, Len Bass. 69-75 [doi]