LaVA: An Effective Layer Variation Aware Bad Block Management for 3D CT NAND Flash

Shuhan Bai, You Zhou, Fei Wu, Changsheng Xie, Tei-Wei Kuo, Chun Jason Xue. LaVA: An Effective Layer Variation Aware Bad Block Management for 3D CT NAND Flash. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2024, Valencia, Spain, March 25-27, 2024. pages 1-6, IEEE, 2024. [doi]

Abstract

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