Current SiC Power Device Development, Material Defect Measurements and Characterization at Bosch - researchr publication authors

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Daniel Baierhofer. Current SiC Power Device Development, Material Defect Measurements and Characterization at Bosch. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 31-34, IEEE, 2019. [doi]

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