Daniel Baierhofer. Current SiC Power Device Development, Material Defect Measurements and Characterization at Bosch. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 31-34, IEEE, 2019. [doi]
@inproceedings{Baierhofer19, title = {Current SiC Power Device Development, Material Defect Measurements and Characterization at Bosch}, author = {Daniel Baierhofer}, year = {2019}, doi = {10.1109/ESSDERC.2019.8901792}, url = {https://doi.org/10.1109/ESSDERC.2019.8901792}, researchr = {https://researchr.org/publication/Baierhofer19}, cites = {0}, citedby = {0}, pages = {31-34}, booktitle = {49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019}, publisher = {IEEE}, isbn = {978-1-7281-1539-9}, }