Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara. Random Access Scan: A solution to test power, test data volume and test time. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 883-888, IEEE Computer Society, 2004. [doi]
Abstract is missing.