An Efficient Overlapping Event Generation Method for Symmetric System Testing

Devraj Kallappa Bakchowde, Nanda Kishore AS. An Efficient Overlapping Event Generation Method for Symmetric System Testing. In Magdy S. Abadir, Jay Bhadra, Li-C. Wang, editors, 12th International Workshop on Microprocessor Test and Verification, MTV 2011, Austin, TX, USA, December 5-7, 2011. pages 56-59, IEEE, 2011. [doi]

Authors

Devraj Kallappa Bakchowde

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Nanda Kishore AS

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