Devraj Kallappa Bakchowde, Nanda Kishore AS. An Efficient Overlapping Event Generation Method for Symmetric System Testing. In Magdy S. Abadir, Jay Bhadra, Li-C. Wang, editors, 12th International Workshop on Microprocessor Test and Verification, MTV 2011, Austin, TX, USA, December 5-7, 2011. pages 56-59, IEEE, 2011. [doi]
Abstract is missing.