Huub H. C. Bakker, Rory C. Flemmer, Claire L. Flemmer. Coverage of apple surface for adequate machine vision inspection. In 24th International Conference on Mechatronics and Machine Vision in Practice, M2VIP 2017, Auckland, New Zealand, November 21-23, 2017. pages 1-5, IEEE, 2017. [doi]
@inproceedings{BakkerFF17,
title = {Coverage of apple surface for adequate machine vision inspection},
author = {Huub H. C. Bakker and Rory C. Flemmer and Claire L. Flemmer},
year = {2017},
doi = {10.1109/M2VIP.2017.8211493},
url = {https://doi.org/10.1109/M2VIP.2017.8211493},
researchr = {https://researchr.org/publication/BakkerFF17},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {24th International Conference on Mechatronics and Machine Vision in Practice, M2VIP 2017, Auckland, New Zealand, November 21-23, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6546-2},
}