Coverage of apple surface for adequate machine vision inspection

Huub H. C. Bakker, Rory C. Flemmer, Claire L. Flemmer. Coverage of apple surface for adequate machine vision inspection. In 24th International Conference on Mechatronics and Machine Vision in Practice, M2VIP 2017, Auckland, New Zealand, November 21-23, 2017. pages 1-5, IEEE, 2017. [doi]

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