Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin. The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. In Jari Nurmi, Peeter Ellervee, Kari Halonen, Juha Röning, editors, 2019 IEEE Nordic Circuits and Systems Conference, NORCAS 2019: NORCHIP and International Symposium of System-on-Chip (SoC), Helsinki, Finland, October 29-30, 2019. pages 1-7, IEEE, 2019. [doi]
Abstract is missing.