Kedarnath J. Balakrishnan, Nur A. Touba. Matrix-Based Test Vector Decompression Using an Embedded Processor. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 159-165, IEEE Computer Society, 2002. [doi]
Abstract is missing.