Modeling of oxide-based ECRAM programming by drift-diffusion ion transport

Matteo Baldo, Daniele Ielmini. Modeling of oxide-based ECRAM programming by drift-diffusion ion transport. In IEEE International Memory Workshop, IMW 2021, Dresden, Germany, May 16-19, 2021. pages 1-4, IEEE, 2021. [doi]

Abstract

Abstract is missing.