Tian Ban, Jianxin Wang, Ting An, Lirida A. B. Naviner. Modeling of transient faults and fault-tolerant design in nanoelectronics. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 545-548, IEEE, 2013. [doi]
Abstract is missing.