Vitor V. Bandeira, Felipe Rosa, Ricardo Reis 0001, Luciano Ost. Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques. In Carolina Metzler, Pierre-Emmanuel Gaillardon, Giovanni De Micheli, Carlos Silva Cárdenas, Ricardo Reis 0001, editors, VLSI-SoC: New Technology Enabler - 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cusco, Peru, October 6-9, 2019, Revised and Extended Selected Papers. Volume 586 of IFIP Advances in Information and Communication Technology, pages 115-137, Springer, 2019. [doi]
Abstract is missing.