Abstract is missing.
- Software-Based Self-Test for Delay FaultsMichelangelo Grosso, Matteo Sonza Reorda, Salvatore Rinaudo. 1-19 [doi]
- On Test Generation for Microprocessors for Extended Class of Functional FaultsAdeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik. 21-44 [doi]
- Robust FinFET Schmitt Trigger Designs for Low Power ApplicationsLeonardo B. Moraes, Alexandra Lackmann Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis. 45-68 [doi]
- An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient FaultsRafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa, Paulo F. Butzen. 69-88 [doi]
- Process Variability Impact on the SET Response of FinFET Multi-level DesignLeonardo H. Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis 0001. 89-113 [doi]
- Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection TechniquesVitor V. Bandeira, Felipe Rosa, Ricardo Reis 0001, Luciano Ost. 115-137 [doi]
- A Statistical Wafer Scale Error and Redundancy Analysis SimulatorAtishay, Ankit Gupta 0010, Rashmi Sonawat, Helik Kanti Thacker, Prasanth B. 139-163 [doi]
- Hardware-Enabled Secure Firmware Updates in Embedded SystemsSolon Falas, Charalambos Konstantinou, Maria K. Michael. 165-185 [doi]
- Reliability Enhanced Digital Low-Dropout Regulator with Improved Transient PerformanceLongfei Wang, Soner Seçkiner, Selçuk Köse. 187-208 [doi]
- Security Aspects of Real-Time MPSoCs: The Flaws and Opportunities of Preemptive NoCsBruno Forlin, Cezar Reinbrecht, Johanna Sepúlveda. 209-233 [doi]
- Offset-Compensation Systems for Multi-Gbit/s Optical ReceiversLászló Szilágyi, Jan Plíva, Ronny Henker. 235-255 [doi]
- Accelerating Inference on Binary Neural Networks with Digital RRAM ProcessingJoão Vieira, Edouard Giacomin, Yasir Mahmood Qureshi, Marina Zapater, Xifan Tang, Shahar Kvatinsky, David Atienza, Pierre-Emmanuel Gaillardon. 257-278 [doi]
- Semi- and Fully-Random Access LUTs for Smooth FunctionsY. Serhan Gener, Furkan Aydin, Sezer Gören, H. Fatih Ugurdag. 279-306 [doi]
- A Predictive Process Design Kit for Three-Independent-Gate Field-Effect TransistorsPatsy Cadareanu, Ganesh Gore, Edouard Giacomin, Pierre-Emmanuel Gaillardon. 307-322 [doi]
- Exploiting Heterogeneous Mobile Architectures Through a Unified Runtime FrameworkChen-Ying Hsieh, Ardalan Amiri Sani, Nikil D. Dutt. 323-344 [doi]