Vitor V. Bandeira, Felipe Rosa, Ricardo Augusto da Luz Reis, Luciano Ost. Non-intrusive Fault Injection Techniques for Efficient Soft Error Vulnerability Analysis. In 27th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cuzco, Peru, October 6-9, 2019. pages 123-128, IEEE, 2019. [doi]
Abstract is missing.