Subir Bandyopadhyay, Bhargab B. Bhattacharya. On the Testable Design of Bilateral Bit-Level Systolic Arrays. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 1024-1033, IEEE Computer Society, 1991.
Abstract is missing.