S. Bandyopadhyay, J. Mekkoth, M. Hutner, H. Grigoryan, A. Kumar S. Shoukourian, G. Tshagharyan, Yervant Zorian, G. Boschi, D. Lazzarotti, D. Luongo, H. Shaheen, Gurgen Harutyunyan. Innovative Practices on In-System Test and Reliability of Memories. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1, IEEE, 2019. [doi]