Shibaji Banerjee, Dipanwita Roy Chowdhury, Bhargab B. Bhattacharya. A programmable built-in self-test for embedded DRAMs. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 58-63, IEEE Computer Society, 2005. [doi]
@inproceedings{BanerjeeCB05, title = {A programmable built-in self-test for embedded DRAMs}, author = {Shibaji Banerjee and Dipanwita Roy Chowdhury and Bhargab B. Bhattacharya}, year = {2005}, doi = {10.1109/MTDT.2005.14}, url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2005.14}, researchr = {https://researchr.org/publication/BanerjeeCB05}, cites = {0}, citedby = {0}, pages = {58-63}, booktitle = {13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan}, publisher = {IEEE Computer Society}, isbn = {0-7695-2313-7}, }