Shibaji Banerjee, Dipanwita Roy Chowdhury, Bhargab B. Bhattacharya. A programmable built-in self-test for embedded DRAMs. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 58-63, IEEE Computer Society, 2005. [doi]
Abstract is missing.