Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs

Sanmitra Banerjee, Arjun Chaudhuri, Krishnendu Chakrabarty. Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs. IEEE Trans. VLSI Syst., 28(6):1513-1526, 2020. [doi]

Abstract

Abstract is missing.