Sanmitra Banerjee, Arjun Chaudhuri, Shao-Chun Hung, Krishnendu Chakrabarty. Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 152-157, IEEE, 2021. [doi]
@inproceedings{BanerjeeCHC21,
title = {Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits},
author = {Sanmitra Banerjee and Arjun Chaudhuri and Shao-Chun Hung and Krishnendu Chakrabarty},
year = {2021},
doi = {10.23919/DATE51398.2021.9473921},
url = {https://doi.org/10.23919/DATE51398.2021.9473921},
researchr = {https://researchr.org/publication/BanerjeeCHC21},
cites = {0},
citedby = {0},
pages = {152-157},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021},
publisher = {IEEE},
isbn = {978-3-9819263-5-4},
}