Sanmitra Banerjee, Arjun Chaudhuri, Shao-Chun Hung, Krishnendu Chakrabarty. Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 152-157, IEEE, 2021. [doi]
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