Sanmitra Banerjee, Arjun Chaudhuri, August Ning, Krishnendu Chakrabarty. Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits. IEEE Trans. VLSI Syst., 29(2):409-422, 2021. [doi]
@article{BanerjeeCNC21,
title = {Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits},
author = {Sanmitra Banerjee and Arjun Chaudhuri and August Ning and Krishnendu Chakrabarty},
year = {2021},
doi = {10.1109/TVLSI.2020.3045417},
url = {https://doi.org/10.1109/TVLSI.2020.3045417},
researchr = {https://researchr.org/publication/BanerjeeCNC21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {29},
number = {2},
pages = {409-422},
}