Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits

Sanmitra Banerjee, Arjun Chaudhuri, August Ning, Krishnendu Chakrabarty. Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits. IEEE Trans. VLSI Syst., 29(2):409-422, 2021. [doi]

Abstract

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