Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee. Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 58-63, IEEE Computer Society, 2011. [doi]
@inproceedings{BanerjeeSDC11,
title = {Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures},
author = {Aritra Banerjee and Shreyas Sen and Shyam Kumar Devarakond and Abhijit Chatterjee},
year = {2011},
doi = {10.1109/VTS.2011.5783755},
url = {http://dx.doi.org/10.1109/VTS.2011.5783755},
tags = {testing},
researchr = {https://researchr.org/publication/BanerjeeSDC11},
cites = {0},
citedby = {0},
pages = {58-63},
booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
publisher = {IEEE Computer Society},
}