Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee. Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 58-63, IEEE Computer Society, 2011. [doi]
Abstract is missing.