Hyeonsu Bang, Kang Eun Jeon, Johnny Rhe, Jong Hwan Ko. DCR: Decomposition-Aware Column Re-Mapping for Stuck-At-Fault Tolerance in ReRAM Arrays. In 41st IEEE International Conference on Computer Design, ICCD 2023, Washington, DC, USA, November 6-8, 2023. pages 491-494, IEEE, 2023. [doi]
Abstract is missing.