Scaling challenges of FinFET technology at advanced nodes and its impact on SoC design (Invited)

Srinivasa Banna. Scaling challenges of FinFET technology at advanced nodes and its impact on SoC design (Invited). In 2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015. pages 1-8, IEEE, 2015. [doi]

Abstract

Abstract is missing.