Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects

Fang Bao, Ke Peng, Mohammad Tehranipoor, Krishnendu Chakrabarty. Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(10):1583-1594, 2013. [doi]

Abstract

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