Jerzy Baranowski, Adrian Dudek, Rafal Mularczyk. Transient Anomaly Detection Using Gaussian Process Depth Analysis. In 25th International Conference on Methods and Models in Automation and Robotics, MMAR 2021, Międzyzdroje, Poland, August 23-26, 2021. pages 221-226, IEEE, 2021. [doi]
Abstract is missing.