A Parametric Design of a Built-in Self-Test FIFO Embedded Memory - researchr publication authors

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Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Gabriel de Blasio, M. Ferloni, Franco Fummi, Donatella Sciuto. A Parametric Design of a Built-in Self-Test FIFO Embedded Memory. In 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996. pages 221-230, IEEE Computer Society, 1996. [doi]

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