Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Gabriel de Blasio, M. Ferloni, Franco Fummi, Donatella Sciuto. A Parametric Design of a Built-in Self-Test FIFO Embedded Memory. In 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996. pages 221-230, IEEE Computer Society, 1996. [doi]
@inproceedings{BarbagalloBMBFFS96,
title = {A Parametric Design of a Built-in Self-Test FIFO Embedded Memory},
author = {Stefano Barbagallo and Monica Lobetti Bodoni and Davide Medina and Gabriel de Blasio and M. Ferloni and Franco Fummi and Donatella Sciuto},
year = {1996},
doi = {10.1109/DFTVS.1996.572028},
url = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.1996.572028},
researchr = {https://researchr.org/publication/BarbagalloBMBFFS96},
cites = {0},
citedby = {0},
pages = {221-230},
booktitle = {1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996},
publisher = {IEEE Computer Society},
isbn = {0-8186-7545-4},
}