J. Barceló, I. de Paúl, Sebastiàn A. Bota, Jaume Segura, Jaume Verd. Bistability in a CMOS-MEMS Thermally Tuned Microbeam Resonator. In IEEE International Symposium on Circuits and Systems, ISCAS 2018, 27-30 May 2018, Florence, Italy. pages 1-5, IEEE, 2018. [doi]
@inproceedings{BarceloPBSV18,
title = {Bistability in a CMOS-MEMS Thermally Tuned Microbeam Resonator},
author = {J. Barceló and I. de Paúl and Sebastiàn A. Bota and Jaume Segura and Jaume Verd},
year = {2018},
doi = {10.1109/ISCAS.2018.8351225},
url = {https://doi.org/10.1109/ISCAS.2018.8351225},
researchr = {https://researchr.org/publication/BarceloPBSV18},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2018, 27-30 May 2018, Florence, Italy},
publisher = {IEEE},
isbn = {978-1-5386-4881-0},
}