J. Barceló, I. de Paúl, Sebastiàn A. Bota, Jaume Segura, Jaume Verd. Bistability in a CMOS-MEMS Thermally Tuned Microbeam Resonator. In IEEE International Symposium on Circuits and Systems, ISCAS 2018, 27-30 May 2018, Florence, Italy. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.